IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
Online ISSN : 1745-1337
Print ISSN : 0916-8508
Soft Binary Hypothesis Testing via Tunable Loss Functions
Akira KAMATSUKATakahiro YOSHIDA
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JOURNAL FREE ACCESS Advance online publication

Article ID: 2025TAP0016

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Abstract

In this study, we investigate soft binary hypothesis testing using a random sample, wherein decisions are made based on a soft test function. To evaluate this test function, we introduce two classes of tunable loss functions and define generalized type I and II errors, as well as Bayesian errors. We analyze the trade-offs between these errors and establish asymptotic results that extend the Neyman-Pearson lemma, the Chernoff-Stein lemma, and Chernoff information in classical binary hypothesis testing.

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© 2025 The Institute of Electronics, Information and Communication Engineers
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