SPring-8/SACLA Research Report
Online ISSN : 2187-6886
Section B
XAFS Analysis of Mg Dopant in Nitride Semiconductors Using Energy-Selective Fluorescence Yield Measurement
Atsushi Sakaki, Tomoaki Kawamura, Atsushi Yoshinari, Munehiko Miyano, Yusuke Tamenori
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Keywords: FEFF, 2013A1658, BL27SU
JOURNAL OPEN ACCESS

2014 Volume 2 Issue 1 Pages 125-129

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[in Japanese]
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