Giant magnetoresistance (GMR) in Co/Cu metallic multilayers was measured with a current perpendicular to the plane (CPP) at room temperature. Micro-pillar structures with a height of 1.0 a m and widths ranging from 15 to 25 u m, fabricated by using optical lithogrphy and Ar ion etching techniques, were used for the measurement. The CPP MR in Co (3 nm)/Cu (2 nm) multilayers was found to be 2.5 times larger than the MR with a current in the film plane (CIP).