The accuracy of a stylus probe method in measuring localized magnetic properties of grain-oriented silicon steel sheet was investigated and its application was studied. The measuring error for the localized flux density was determined to be less than 1.7% for the load onto the stylus tip lighter than 300g when the yoke structure was symmetrical with respect to the sheet plane. The average of localized iron losses measured with the combination of a stylus probe and a Hall probe was in linear relation with the loss in the whole sheet. This method revealed that the localized magnetic properties vary markedly portion to portion in a sheet and that the localized iron loss depends on the localized flux density, domain wall spacing and yaw angle of grain orientation.