IEEJ Transactions on Electronics, Information and Systems
Online ISSN : 1348-8155
Print ISSN : 0385-4221
ISSN-L : 0385-4221
Degradation Detection Methods for Analogue ICs Using in Real Plants
Hiroshi Inujima, Uichi Kichijima
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1989 Volume 109 Issue 12 Pages 862-868

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