“A Survey of Test Technology of LSI”

IEEJ Transactions on Electronics, Information and Systems

Online ISSN : 1348-8155
Print ISSN : 0385-4221
ISSN-L : 0385-4221

“A Survey of Test Technology of LSI”

Kozo Kinoshisa

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JOURNAL FREE ACCESS

1987 Volume 107 Issue 3 Pages 220-226

DOI https://doi.org/10.1541/ieejeiss1987.107.3_220

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