IEEJ Transactions on Electronics, Information and Systems
Online ISSN : 1348-8155
Print ISSN : 0385-4221
ISSN-L : 0385-4221
<Systems, Instrument, Control>
Measurement of Complex Permittivity of a Dielectric Thin Film by the Cylindrical Cavity Resonator Having Sliding End Plates
Yoshinori KogamiKazufumi IgarashiTakashi Shimizu
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2020 Volume 140 Issue 4 Pages 492-495

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Abstract

This technical report shows a measurement technique for the complex permittivity of a dielectric thin film with the cylindrical resonator having sliding end plates in the millimeter wave region. In order to eliminate the influence of unwanted TM111 resonance mode which is frequently appeared on the response of TE011 for measurement of the dielectric thin film, the position of the end plates is adjusted adequately. The methodology and experimental results are presented to show the usefulness of this technique.

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© 2020 by the Institute of Electrical Engineers of Japan
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